Defects and Synchrotron X-Ray Topography in Silicone-Carbide Based Devices

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Defects and Synchrotron X-Ray Topography in Silicone-Carbide Based Devices

by Juraj Marek , Gregor Pobegen , Ulrike Grossner

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First published: 2023 1 language ISBN: 9783036403328

Subjects

Mechanical engineering Materials Electronics

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