by James L. Lauer
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Ellipsometric surface analysis of wear t...
Surface topographical changes measured b...
Polarization modulated ellipsometry
Determination of physical and chemical s...
Tribology for Practicing Engineers (Mech...
Emission FTIR analyses of thin microscop...
Infrared Imaging Systems
Molekülspektren und Molekülstruktur
The Handbook of infrared and raman spect...
The infra-red spectra of complex molecul...
Spectrometric identification of organic ...
Handbook of near-Infrared Analysis