Advanced characterization techniques for optics, semiconductors, and nanotechnologies III View on Open Library

Advanced characterization techniques for optics, semiconductors, and nanotechnologies III

by Angela Duparré

No reviews yet
First published: 2007 1 language ISBN: 9780819468208
Subjects
Optical properties Characterization Semiconductors Optoelectronics Thin films Optoelectronic devices Congresses Optical measurements Nanotechnology Interferometry

Reviews

Log in or sign up to write a review.

No reviews yet. Be the first!

More by Angela Duparré

Optical fabrication, testing, and metrology III

Optical fabrication, testing, and metrol...

Advanced characterization techniques for optics, semiconductors, and nanotechnologies

Advanced characterization techniques for...

Optical metrology roadmap for the semiconductor, optical, and data storage industries II

Optical metrology roadmap for the semico...

Optical metrology roadmap for the semiconductor, optical, and data storage industries

Optical metrology roadmap for the semico...

Advanced characterization techniques for optical, semiconductor, and data storage components

Advanced characterization techniques for...

You Might Also Like

More in Optical properties
Sensory evaluation techniques

Sensory evaluation techniques

Morten Meilgaard
Advances in Electronics and Electron Physics (Advances in Imaging and Electron Physics)

Advances in Electronics and Electron Phy...

Peter W. Hawkes
Graphene Science Handbook

Graphene Science Handbook

Mahmood Aliofkhazraei
Aggregation-Induced Emission

Aggregation-Induced Emission

Anjun Qin
My World of Science

My World of Science

Angela Royston
Metal electrodeposition

Metal electrodeposition

Robert K. Bregg