On-Wafer Calibration Techniques Enabling Accurate Characterization of High-Performance Silicon Devices at the Mm-Wave Range View on Open Library

On-Wafer Calibration Techniques Enabling Accurate Characterization of High-Performance Silicon Devices at the Mm-Wave Range

by Andrej Rumiantsev

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First published: 2019 1 language ISBN: 9788770221115

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